Abstract
Thin films (~ 150 nm) of amorphous As30Te69Ga1 were prepared by the thermal evaporation method on glass substrates from the bulk As30Te69Ga1 sample. XRD analysis reveals the glassy nature of thermally evaporated As30Te69Ga1 thin films, while the annealed samples are crystalline. The linear and nonlinear optical properties of As30Te69Ga1 thin films are tuned by the annealing process and the optical investigations carried out by analysis of the transmittance and reflectance spectra for thin films. The bandgap (Eg) and Urbach (Ee) energies of annealed samples reveal opposite trends along with annealing temperature (TA) where Eg reduced as TA rises (393 ≤ TA (K) ≤ 433), while increases for further increase in TA (TA > 433 K). The complex refractive index, extension coefficient, optical and electrical conductivities, nonlinear optical susceptibility, optical surface resistance, thermal emission, etc. are significantly affected by TA and the wavelength of electromagnetic waves. The results provide knowledge about the electronic band structure of As30Te69Ga1 which emphasizes that such films qualify for various thermos-optical applications.
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