Abstract

The present work focuses on the deposition of ZnO thin films on crystalline and porous Germanium substrates for hazardous gas detection. The porous Ge substrates were obtained by means of surface exfoliation by using H+ implantation and subsequent annealing. Morphological analysis revealed the formation of pores in the range between 1 and 5 µm. The deposition of ZnO thin films has been made on crystalline and porous Ge substrates utilizing the dip coating method. Structural and morphological characterizations confirmed the formation of highly porous polycrystalline ZnO film exclusively on porous Ge substrates. All the obtained samples were tested for their sensitivities at 0.1, 0.5, 1 and 2% of CO2 concentrations. The ZnO films deposited on porous Ge exhibited an increment of sensing response by a factor of 2, which is correlated to the increment of the superficial area induced by the substrate. Maximum sensing response ~ 50% was achieved for 2% of CO2 when measured at 300 °C. ZnO over porous Ge films showed complete resistance recovery, whereas ZnO over crystalline Ge showed a drift in the recovery resistance. ZnO deposited porous Ge showed the fastest response and recovery time ~ 25 and 10 s, respectively.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.