Abstract
Optimized diffractometer arrangements for residual strain measurements employing curved crystal monochromators provide good luminosity and a high Δd/d resolution in the vicinity of usually used scattering angle 2θS≈±90°. Due to a variety of designs of the diffractometers which could be installed at a constant or different take-off angles, except a few attempts, there is a lack of experimental evidence providing a help in a choice of parameters for an optimum performance. In addition to our earlier investigations with curved Si(311) monochromator employed in different diffraction geometries (see paper I [M.K. Moon et al., Physica B, submitted [1]]), the present paper presents the monochromator properties of cylindrically bent perfect Si(220) crystals as another candidate to be used as monochromator in residual strain diffractometers.
Published Version
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