Optimization of a cycle time and utilization in semiconductor test manufacturing using simulation based, on-line, near-real-time scheduling system

Abstract

A discrete event simulation based on-line near-real-time dynamic scheduling and optimization system has been conceptualized, designed, and developed to optimize cycle time and asset utilization in the complex manufacturing environment of semiconductor test manufacturing. Our approach includes the application of rules and optimization algorithm, using multiple variables as an integral part of discrete event simulation of the manufacturing operation and auto simulation model generation at a desired frequency. The system has been implemented at a semiconductor back-end site. The impact of the system includes the achievement of world class cycle time, improved machine utilization, reduction in the time that planners and manufacturing personnel spend on scheduling, and more predictable and highly repeatable manufacturing performance. In addition it enables managers and senior planners to carry out what if analysis to plan for future.