Abstract

Life testing is an essential reliability assessment procedure to qualify a new product or technology before being released to the market. High-brightness white light-emitting diodes (HBWLEDs) with high efficiency, environmental benefits, and high reliability have attracted increasing interest in the field of lighting systems. However, owing to the long lifetime of LEDs, traditional life testing methods for LEDs, which record only failure time, are time consuming and expensive. Therefore, designing an optimal life testing process for HBWLEDs is desirable for accelerating LED technology innovation and development. This paper applies the Six Sigma define–measure–analyze–improve-control (DMAIC) approach to analyze the restrictions in the traditional life testing for HBWLEDs and optimize the life testing procedure. The goal is to shorten the testing time, reduce the testing operation cost, and maintain accurate reliability estimation. In this work, a general reliability estimation method with degradation data is developed by integrating a recursive unscented Kalman filter approach to estimate HBWLED reliability. The results show that, with the help of a recursive UKF, the accuracy of reliability estimation can be improved compared with the ordinary nonlinear least squares approach. Furthermore, the operation time and cost of LED life testing can be reduced by 57.75% and 71.51%, respectively, compared with traditional life testing.

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