Abstract
Optimal designs of constant-stress accelerated life test plans is one of the important topics in reliability studies. Many devices produced have very high reliability under normal operating conditions. The question then arises of how to make the optimal decisions on life test plans to collect sufficient information about the corresponding lifetime distributions. Accelerated life testing has become a popular approach to tackling this problem in reliability studies, which attempts to extrapolate from the information obtained from accelerated testing conditions to normal operating conditions. In this paper, we develop a general framework to obtain optimal constant-stress accelerated life test plans for one-shot devices with dependent components, subject to time and budget constraints. The optimal accelerated test plan considers an economical approach to determine the inspection time and the sample size of each accelerating testing condition so that the asymptotic variance of the maximum likelihood estimator for the mean lifetime under normal operating conditions is minimized. This study also investigates the impact of the dependence between components on the optimal designs and provides practical recommendations on constant-stress accelerated life test plans for one-shot devices with dependent components.
Highlights
One-shot device test data analysis has received increased attention in reliability studies
We assume that the cost of conducting a constant-stress ALT (CSALT) consists of two terms: the cost linked to the purchase of the devices and the cost associated with operation at each accelerating operating condition
We have considered a one-shot device with dependent components having exponential lifetime distribution under gamma frailty and developed a procedure for obtaining the optimal CSALT plan with budget and time constraints
Summary
One-shot device test data analysis has received increased attention in reliability studies. When practitioners are dealing with one-shot device test data, they are usually facing great challenges with a limited time and resources, in addition to a lack of information inherently presented in the data collection. In this regard, accelerated life testing has been widely adopted in reliability studies to collect sufficient lifetime information by subjecting specimens/devices to higher-than-normal operating conditions to induce rapid failures. A recent book [4] provides an overview of accelerated life testing of one-shot devices and presents several inferential methods for analyzing one-shot devices Balakrishnan and his collaborators have made substantial efforts in the past few years to further advance the methodologies for analysis and data collection of one-shot devices [5–12]
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