Abstract

Very large scale integrations (VLSIs) used in high radiation environments such as outer space and nuclear power plants are constantly affected by radiation. Since VLSIs are vulnerable to radiation, existing VLSIs have an inherent difficulty that temporary or permanent failures occur in high-radiation environments. In order to improve the radiation tolerance of current VLSIs, optically reconfigurable gate arrays consisting of a holographic memory, a laser array, and a programmable gate array VLSI using a standard CMOS process technology have been being developed. The radiation tolerance of the optically reconfigurable gate array has drastically been improved by exploiting its programmable capability based on a configuration function strong for radiation. However, the configuration circuit still includes common signals that decrease the radiation tolerance. This paper present a proposal of a new optically reconfigurable gate array VLSI that perfectly removes the common signals and its experimental results obtained from testing it.

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