Abstract

Recently, radiation-hardened SRAM-based field programmable gate arrays (FPGAs), anti-fuse FPGAs, and radiation-hardened flash-based FPGAs have been used frequently for space systems. The total-ionizing-dose tolerances of such radiation-hardened FPGAs are limited to a 1 Mrad total ionizing dose. However, if the total-ionizing-dose tolerance of the embedded systems could be increased, a shield-less space embedded system could be realized, drastically decreasing rocket launch costs. This paper therefore presents a proposal of a new, radiation-hardened optically reconfigurable gate array very large scale integration (VLSI) exploiting its parallel configuration. The total-ionizing-dose tolerance of the radiation-hardened optically reconfigurable gate array has been measured experimentally as a 603 Mrad total-ionizing-dose using a Cobalt 60 gamma radiation source, which has at least 603 times higher radiation tolerance than those of currently available radiation-hardened FPGAs.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.