Abstract
In this work, a planar waveguide was fabricated by proton implantation in Er3+/Yb3+-codoped silicate glasses with energies of (500 + 550) keV and fluences of (1 + 2) × 1016 ions/cm2. The end-face coupling method was employed to determine whether the light could be confined in the waveguide or not. The prism coupling technique was applied to measure the guided mode spectrum and the intensity calculation method was used to construct the refractive index profile. With the profile, a near-field intensity distribution was calculated by the finite difference beam propagation method. The obtained results may be helpful in developing integrated optical devices.
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