Abstract

A structural transformation induced by optical impulse excitation of only a few mJ/cm2 fluence affecting the nanoscale surface melt layer of gallium at a ZnSe–gallium interface leads to a fast, substantial and fully reversible change in reflectivity of up to 50%. Recovery occurs within a few μs after excitation is withdrawn and less than 1μs at temperatures more than 4K below gallium’s melting point.

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