Abstract
SUMMARYWe discuss how the strength of the optical sectioning property of the direct‐view reflection microscope varies with the size and distribution of the pin‐holes in the source and detector arrays. Finite‐sized circular pin‐holes are considered in both bright‐field and fluorescence imaging and the results are compared with those of the corresponding scanning optical microscope. We discuss the effect of using both incoherent and coherent illumination.
Published Version
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