Abstract
Single crystal of the Sc2Si2O7:Ce (SPS:Ce) was grown by floating zone method. The crystal structure is confirmed to be thortveitite with space group C2/m by X-ray diffraction measurement. The vacuum ultra violet (VUV), photoluminescence excitation (PLE) and photoluminescence (PL) spectra, fluorescence decay time and X-ray excited luminescence spectra were studied. Five sublevels of Ce3+ 5d level are observed through the VUV PLE spectra. The PL is dominated by the fast Ce3+ 5d14f0–5d04f1 transition peaking at 386nm with a single exponential decay of 33ns. The traps in SPS:Ce were also studied through the thermally stimulated luminescence measurement. A trap with level depth 1.16eV with a kinetics order of 1.52 is found in the SPS:Ce crystal.
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