Abstract

Thin films were grown on quartz substrates and crystalline silicon wafers using disodium phthalocyanine and the organic ligands 2,6-diaminoanthraquinone, 2,6-dihydroxianthraquinone and its potassium derivative salt. The surface morphology of these films was analysed by atomic force microscopy (AFM) and scanning electron microscopy (SEM). IR spectroscopy was employed in order to investigate possible changes of the intra-molecular bonds between the powder compounds and thin films. The optical parameters have been investigated using spectrophotometric measurements of absorbance in the wavelength range of 200–1100 nm and the effects of post-deposition heat treatment were analysed. The absorption spectra recorded in the UV-Vis region for the deposited samples showed two bands, namely the Q and Soret bands. The absorption coefficient in the absorption region reveals non-direct transitions. In addition, the optical gap dependence upon the thickness of these thin films was evaluated.

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