Abstract
Thin films of zinc sulphide, in single-crystal and in polycrystalline form, were grown by vacuum deposition methods onto silicon and gallium arsenide substrates. The thin film optical constants are determined from a computer solution of the optical waveguide dispersion relationship for measured effective indices and loss of guided modes excited by prism coupling of laser light at discrete wavelenghts between 465.8 and 632.8 nm. Sputtered films exhibit much higher levels of absorption than films prepared in ultrahigh vacuum from a molecular beam source, yet both preparation techniques give consistent values of the refractive index close to those measured for bulk material. High absorption also occurs in films prepared from heavily doped sources. The lowest absorption coefficient obtained was 1.4 cm -1 at 632.8 nm in an ultrahigh-vacuum-deposited film. At the same wavelenght, bulk absorption is 0.7 cm -1 and sputtered film absorption is 10.6 cm -1.
Published Version
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