Abstract

Tetrapod nanostructured zinc oxide (ZnO) thin films have been deposited onto indium tin oxide (ITO) coated glass substrate by thermal chemical vapor deposition (TCVD) technique. This work studies the effects of annealing temperature ranging from 100–500 oC towards its physical and optical properties. FESEM images showed that the structural properties of tetrapod nanostructured ZnO thin film were affected by the annealing temperature. The thickness of thin film is strongly support the FESEM analysis. The optical band gap energy (Eg) was evaluated at 2.78 – 3.06 eV, which the ZnO thin film was found to be influenced by the change of interatomic spacing of semiconductor. The result shows that the higher annealing temperature greatly affects the physical structure of tetrapod nanostructured ZnO thin film to become narrow and longer length. Keywords: tetrapod; TCVD; synthesizing; annealing; zinc oxide

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.