Abstract
The optical properties of well‐activated Cs2O and Ag–Cs2O thin films have been studied. These films are important for photoemission, especially for the ultrashort laser pulse detection. The curves for the index of refraction n, extinction coefficient k, and complex dielectric constant of Cs2O with different Cs impurity content are derived as a function of wavelengths of visible and infrared lights. The variations of front reflectance RF, vacuum reflectance RV, and transmittance T of the Cs2O thin film with an amount of Ag added into it were measured. The effects of sizes and shapes of metal colloidal particles embedded in semiconductor thin film on light absorption and scattering are discussed theoretically. The values of the absorption coefficient of Ag–Cs2O are also calculated.
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