Optical profiler

Abstract

No modern non-destructive testing device, due to its design features, makes it possible to make metrological measurements necessary to build a three-dimensional geometric model of the surface of the part, which is a superposition of the geometric image of the surface and the topography of its microrelief. A device for non-destructive passive control over the formation of the geometry and topography of the microrelief of the surface for metrological measurements of the holographic image of an object in the optical frequency range of electromagnetic waves has been developed. The device does not have probes interacting with the real object under study and, accordingly, the error of metrological measurements decreases. The principle of operation of a profilograph operating in the optical frequency range of electro-magnetic waves is that it is not the object itself that is being studied, but its holographic image. The device provides a modular geometric approach for modeling the surface of the part, which allows structuring a three-dimensional geometric model of the surface, which is a superposition of the geometry and topography of the microrelief. The device has better functional characteristics compared to prototypes in terms of measurement accuracy, resolution, and versatility of application.