Optical fibre based quench detection in HTS applications using machine learning classifiers

Abstract

A Mach-Zehnder Interferometer (MZI) based optical fibre sensing technique, developed and patented by EPFL, is an efficient and economical way to detect hotspots in High Temperature Superconductor (HTS) applications. Due to the MZI sensitivity being a composite of strain sensitive and temperature sensitive contributions, the MZI gives an instantaneous response to a quench (within 10 ms), because of the quick strain transfer to the optical fibre. However, the MZI output signal can also manifest the environmental noise caused by mechanical vibrations, bubbling in the cryostat and temperature variations, along with the response to the quench. This presents the problems of false alarms and indiscernible response to a quench. Discrete wavelet transform (DWT) has been proven to be a useful tool for feature extraction in different fields requiring signal categorization and hence holds the potential to enable quench recognition in the MZI output. This paper proposes an effective approach of performing DWT based feature extraction on experimental data and subsequently using the extracted features for the MZI response classification using two machine learning based classification techniques: k-nearest neighbours (KNN) and Artificial Neural Network (ANN). For this manuscript, experiments were performed using MZI for quench detection in an HTS tape. Feature extraction was then implemented on these experimental measurements using discrete wavelet coefficients extracted at different decomposition levels from the MZI output; these features were then used to train the KNN and ANN models for identifying quench in the MZI signal. This method could be a valuable supplement to the MZI technique by enabling the development of a real time application that can process the MZI output data as well as eliminate the occurrences of false alarms; thereby facilitating reliable quench detection. With this development, the MZI technique would become an even more attractive solution for the health monitoring of HTS applications.