Abstract
High nucleation density and crystalline diamond films were deposited on a mirror-polished Si(100) substrate by horizontal microwave plasma chemical vapor deposition using a two step process consisting of positive direct current (dc) bias enhanced nucleation and growth. Optical emission spectroscopy was employed to investigate in situ the plasma emission characterization during positive biasing process. Emission lines from the Balmer series of atomic hydrogen, molecular hydrogen, CH, C 2, and Ar were observed in the visible and ultraviolet ranges when CH 4, H 2, and Ar were used as the reactant gases. The dependence of plasma emission spectra on the deposition parameters, such as biasing voltage, methane concentration and working pressure was investigated. The relative concentrations of neutral atomic hydrogen were estimated by using the Ar emission at 750.4 nm as an actinometer. A significant variation in the emission intensity of the radicals was measured with a change in the biasing voltage. The correlation between the spectra of some species and the quality of diamond films was studied. The results show that CH and C 2 both were important precursor in the diamond deposition, while C 2 was associated with the presence of amorphous phase in the films during positive dc biasing process.
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