Abstract
Optical constants of very thin platinum and rhodium films for soft X-rays (70–900 eV) have been determined using two techniques of independent measurements of the reflectance and the total photoelectric yield for the same samples. The measured reflectances were analyzed with a plane parallel slab model with a Debye-Waller factor, with consideration given to the surface roughness. The total photoelectric yield data were examined with a model based upon Pepper's formula. The corresponding optical constants agreed well with each other, showing the degree of reliability on the optical constants in the soft X-ray region.
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