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Abstract
Total photoelectric yield measurements were performed on ∼ 800 A ̊ thick Al films evaporated in ultrahigh vacuum on glass substrates. Fitting of the photoelectric yield as a function of angle of incidence using Pepper's equations yielded optical constants in excellent agreement with those obtained from reflectance measurements on the same films. This establishes a convenient method for determining optical constants and yields in addition values for film thickness and electron escape depths.
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