Abstract
AbstractIt is well known that the development and determination of optical properties of ultrathin films is an important issue in many technological areas. In this work organic polyethylene (PE) and cobalt phthalocyanines (CoPc) ultrathin films were deposited over metal films using the r.f. sputtering and thermal evaporation techniques, respectively. Attenuated total reflection (ATR) measurements for the system organic film/metal at the surface plasmon resonance (SPR) were used for determining the thicknesses and optical properties of the PE and CoPc thin films. Thicknesses of the order of some nanometers were found, fitting the theoretical multilayer ATR model, for p polarization monochromatic light, to the experimental reflection data. The dielectric function of CoPc ultrathin films was determined at a wavelength of 632.8 nm. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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