Abstract
We report the observation of morphology-dependent resonances from silicon microspheres. The dropped channels are observed both in the transmission and elastic scattering spectra in the O-band. The filter drops approximately 23% of the power at the resonance wavelength. The highest observed quality factor for the morphology-dependent resonances was on the order of 10/sup 5/. These resonances have a linewidth of 0.007 nm and a mode spacing of 0.19 nm.
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