Abstract
To evaluate the image quality of intraocular lenses (IOLs) using field-tracing optical simulation and then compare it with the image quality using conventional ray-tracing simulation. We simulated aspheric IOLs with a decenter, tilt, and no misalignment using an aspheric corneal eye model with a positive spherical aberration. The retinal image, Strehl ratio, and modulation transfer function (MTF) were compared between the ray-tracing and field-tracing optical simulation and confirmed by the results reported in an in vitro experiment using the same eye model. The retinal image showed interference fringes from target due to diffraction from the object in a field-tracing simulation. When compared with the experimental results, the field tracing represented the experimental results more precisely than ray tracing after passing over 400 μm of the decentration and 4 degrees of the tilt of the IOLs. The MTF values showed similar results for the case of no IOL misalignment in both the field tracing and ray tracing. In the case of the 200-μm decentration or 8-degree tilt of IOL, the field-traced MTF shows lower values than the ray-traced one. The field-tracing optical bench simulation is a reliable method to evaluate IOL performance according to the IOL misalignment. It can provide retinal image quality close to real by taking into account the wave nature of light, interference and diffraction to explain to patients having the IOL misalignment.
Highlights
Light is regarded as a ray in geometrical optics but an electromagnetic wave in wave optics [1]
When compared with the experimental results, the field tracing represented the experimental results more precisely than ray tracing after passing over 400 μm of the decentration and 4 degrees of the tilt of the intraocular lenses (IOLs)
The field-tracing optical bench simulation is a reliable method to evaluate IOL performance according to the IOL misalignment
Summary
Light is regarded as a ray in geometrical optics but an electromagnetic wave in wave optics [1]. Ray tracing assumes that the wavelength of light is sufficiently small so that light propagation can be described in terms of rays. It is fast but not accurate enough for simulation of most micro- and nanostructured components [2]. Electromagnetic harmonic fields are traced through the optical system. Field tracing formulates the generalization of ray tracing and of electromagnetic wave modeling [3]. Field tracing of propagating electromagnetic waves allows for a much more accurate description of many optical effects and becomes necessary for small diffractive structures, which cannot be properly modeled by ray tracing [4]
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
