Optical and X‐ray Topographic Studies of Barium Fluoride Single Crystals

Abstract

AbstractSingle crystals of synthetic barium fluoride have been cleaved along {111} planes and the freshly cleaved faces have been etched in (1 : 250) concentration of nitric acid solution. One to one correspondence of dislocation etch pits have been observed on matched pairs. The same crystal has been investigated using X‐ray topographic technique. By selecting 0222 and 0222 reflections and MoKα1 radiation, stereopair projection topographs have been obtained and critically compared with the optical micrograph. One‐to‐one correspondence between dislocation out crop images and dislccation etch pits have been established. Due to dislocation contrast, the outcrop of dislocation images have been observed with the associated dislocation etch pits. The orientation of the Burgers vectors of the dislocation lines have been identified using AgKα1 radiation with 1111, 1111 and 1111 reflections and the implications have been discussed.