Abstract
The structural and optical properties of polycrystalline CdTe thin films are investigated. The films were grown by the standard rf sputtering technique using high purity (5N) CdTe target. X-ray diffraction studies are performed in order to determine structure and texture of samples. It is found that the as grown films show a mixture between hexagonal and cubic phases. It should be noted that the preferential direction of crystallites changes with changing deposition parameters. Optical properties of sputtered films are obtained from transmission measurements in the energy range 0.5–2.5 eV. The results confirm the direct character of the interband transition and the optical constants show a clear variations with deposition parameters and annealing.
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