Abstract
CdS films were grown on glass substrates by the close spaced vapor transport technique (CSVT). We deposited two series of samples: a) with a substrate temperature of 150 °C (group A) and b) with a variation of substrate temperature between 200 °C and 550 °C, at intervals of 50 °C (group B). The samples of group A were annealed in N2 atmosphere, from 200 °C to 400 °C, at intervals of 50 °C. All samples were measured by X-ray diffraction and optical transmission. X-ray diffraction patterns show that the films had a mixture of cubic and hexagonal structure remained unchanged after the thermal annealing, the main phase present was cubic. The energy band gap shows a thermal stability. The substrate temperature has no effect over the crystal structure and band gap energy. Transmittance and X-ray measurements show a thermal stability of the crystal structure and band gap energy. (© 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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