Abstract

For oriented MnBi films, the diagonal and off-diagonal components of the complex dielectric tensor were determined from optical and magneto-optical data measured in the 425 to 1000 nm wavelength range. The complex dielectric tensor indicates that several electronic transitions contributed from the magnetic electrons are located in the 600 to 1000 nm wavelength range, and may be responsible for the large Faraday rotation of MnBi films over this wide wavelength range. The Kerr rotations for s and p polarized waves were measured and calculated from the dielectric tensor as a function of the incident angle at 632.8 nm. The calculated results can explain the general behaviour of the dependence of the measured Kerr rotations on the incident angle.

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