Abstract
In this present work, we report on optical and electrical properties of Cu-doped NiO thin film were deposited on ITO coated glass substrate by using sol-gel spin coating technique. The grown thin films were characterized by Atomic Force Microscopy, UV visible and impedance measurement. The absorption spectra indicates that a strong absorption peak was found at 356.19 nm and also absorption peak values was increased with the increase in doping concentration of copper. The surface roughness of the thin film was estimated by using AFM. From Nyquist plot and Bode plot it was observed that un-doped NiO films shows higher resistivity than doped NiO films, but with increase in value of dopant concentration resistivity increases.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
