Abstract
Low frequency noise characteristics of nitride based blue side emitting diodes have been investigated. It is shown that investigated devices distinguish by 1/f-type optical and electrical fluctuations caused by various generation-recombination processes through defects formed generation-recombination centers. At higher frequencies optical shot noise due to random photon emission prevails 1/f-type spectrum. The results have shown that low frequency optical and electrical noises are strongly correlated at small current region, but at higher forward current not correlated noise components dominate. Lenses and secondary optics of the investigated devices do not influence output light.
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