Abstract
The low and medium frequency (1 Hz/spl les/f/spl les/10 MHz) electrical noise characteristics of 0.98, 1.3, and 1.55 micrometer semiconductor lasers have been investigated. We show that the electrical noise is connected to the optical noise behavior. The correlation between electrical and optical noises is obtained by using the coherence function between these noise sources. This confirms the theoretical predictions issued from Haug's model that this correlation, which originates in the dipole interaction between the optical field and electron-hole pairs, can be extended to the laser diode characterization by using electrical noise measurements.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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