Abstract
In this paper, Mn3O4 thin film was deposited on a Fluorine doped Tin Oxide substrate by the spin coating technique. X-ray diffraction, Raman spectroscopy, and ultra-violet visible spectroscopy were used to explore the structural and optical properties of Mn3O4 thin film. Raman spectrum confirms the phase of Mn3O4 thin film as tetragonal. The optical band gap has been calculated by using the Tauc’s plot and Kubelka-Munk model. The optical analyses suggest that prepared Mn3O4 thin film can be used as a potential candidate for optical semiconductor devices including photovoltaic cells and optical sensors.
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