Abstract
Operational amplifiers (op amps) are fundamental blocks that find wide application both as stand-alone devices and as crucial blocks embedded in various Systems on Chips (SoCs). Achieving high defect coverage, as well as performing defect localization in these circuits, has proven to be a difficult/expensive task, even with sophisticated testing circuitry. The ISO 26262 standard for functional safety (FuSa) includes the stringent requirement that an automotive IC must have a very high defect coverage. This reinforces the need to ensure the functionality of analog and mixed (AMS) circuits, especially in mission critical applications. This paper presents an all-digital op amp defect detection, diagnosis, and localization method that can be used both for production and in-field tests and discusses various implementation of the proposed method. We validated our results using extensive transistor-level simulations of multiple op amp architectures using TSMC 180 nm technology. Across op amp architectures and multiple implementation approaches, we achieved a worst-case and best-case defect coverage of 94.5% and 99%, respectively. Furthermore, in this work, we also propose a defect diagnosis and localization strategy using recorded bit streams from states of digital injectors and detectors.
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