Abstract
An alternative method for characterizing optical propagation in waveguide structures based on scattered light imaging is presented and demonstrated for the spectral range of 450-980 nm. Propagation losses as low as 1.40 dB/cm are demonstrated in alumina spiral waveguides. AlGaAs-on-insulator waveguides are measured using a tunable laser and compared to cut-back measurements. On AlGaAs, a one-sigma uncertainty of 1.40 and 2.23 dB/cm for TE and TM polarizations is obtained for repetitions of measurements conducted on the same waveguide, highlighting the approach's reproducibility. An open-source toolbox is introduced, allowing for reliable processing of data and estimation of optical propagation losses.
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