Open circuit voltage decay in p- n junction diodes at high levels of injection

Abstract

The open circuit voltage decay (OCVD) in p- n junction diodes at high levels of injection is discussed in this paper. Theoretical results are given for thick base diodes and for BSF solar cells including the effect of recombination in the emitter. It is found that the recombination in the emitter becomes important at high levels of injection and makes the voltage decay faster. The experimental results in BSF solar cells at high levels of injection are also reported and found to be in good agreement with the theoretical results derived in this paper.