Abstract
A computer photodiode array is used for registration of the zero and the first diffraction orders from 486 sinusoidal gratings in which the illuminated profile of a random rough surface is expanded. The total diffraction field including the mirror reflected one and the field of the first orders are examined as a sum of light fields, obtained at the diffraction from 486 sinusoidal gratings. It is shown, that the mean roughness Ra, obtained in a standard way by mirror reflected and diffracted fields, is not essentially distinct from this, when the diffraction field and the reflection factor at defined angle of incidence of light field are used. The mean roughness does not depend on the surface material and is only defined from the roughness value. In this case one-dimensional visualization is better than using the reflection factor.
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