Computer Reconstruction of a Random Rough Surface in the Presence of Higher Diffraction Orders

Abstract

Abstract The profile of a random rough surface (RRS), whose mean roughness Ra is greater than the light wavelength, is visualized by computer processing. The surface is presented as a sum of sinusoidal gratings. The light diffracted from this surface field is registered by a photodiode array. The second and third diffraction orders from each grating are taken into account in computer processing of the diffracted field and the mixing field–the field obtained at the mixing of the reference and the diffraction fields. The criterion for taking into account higher diffraction orders is the asymmetry of the diffraction pattern to the left and to the right relative to the central peak (the field of zero diffraction orders obtained from each grating) The number of the diffraction orders higher than the first is defined from the average intensity distribution between the central peak and the diffraction orders to the left and to the right at arbitrary light wavelength. The surface profile is reconstructed by a com...