Abstract
Abstract A simple method of one-step pulse plating was used in the fabrication of core-shell SiO2/Ag composite spheres. Structural characteristics and morphologies of the prepared SiO2/Ag composite spheres are characterized by means of X-ray diffraction, scanning electron microscope, and transmission electron microscopy. The Ag shell is uniformly coated on the surface of SiO2 spheres with the thickness of about 20 nm. Photoluminescence (PL) spectrum has revealed that PL of the core-shell samples is much stronger than that of bare SiO2 spheres. Raman spectrometer measurements show that the SiO2/Ag composite spheres have excellent surface-enhanced Raman scattering performance. In addition, the current-voltage characteristic of SiO2/Ag composite spheres has improved at the same time.
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