Abstract
Application of an on-demand beam deflection system in PIXE analysis has numerous advantages. The suppression of pile-up is accomplished much better than by using pile-up rejection electronic circuits only. In the case of biological and other sensitive types of samples, it is important to minimize the radiation and thermal load. In the case of samples with very different concentrations, the need for beam current correction between sample analyses is not as critical. An on-demand beam deflection system for the analytical facility at the CTU in Prague has been developed and implemented. A pair of electrodes was inserted in the beam line in front of the target chamber. The electrodes are supplied with positive high voltage up to 1 kV and they are a U-shape cross-section to reduce their beam distortion effect. Temporarily, one of the electrodes is shorted to ground potential. The shorting, by a HEXFET ® transistor, occurs in a period of about 100 ns after the edge of the triggering pulse. A description of the system as well as the results of the tests are presented.
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