Abstract
A solution of the problem of X-ray specular reflection from a statistically rough surface is presented. It is based on using the Green function formalism. The Kirchhoff formula is used to describe the transmission of the wave field through a rough interface. Generally, microscopically exact expressions for the coefficients of transmission through a rough surface and reflection from it are obtained by taking multiple scattering effects into account. Averaging of the obtained expressions over possible realizations of random roughness of the interface between media allows to obtain rigorous expressions for specular reflection and transmission coefficients. The behavior of exact solutions in the limiting case of infinite correlation lengths is studied. It is shown that, in this case, the obtained solution corresponds to the Debye-Waller normalization. Expressions for the reflection and transmission coefficients making it possible to carry out numerical calculations are obtained in the Bourret approximation of multiple-scattering theory.
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