Abstract
Microscopic investigation have been carried out to characterise and assess some flux grown cuprate crystals. In addition to optical and electron microscopic examinations, microanalysis was carried out both by electron microprobe analysis (EPMA) and by high resolution analytical electron microscopy (AEM or sometimes referred to as TEM analysis). While EPMA can be used for analysis on an area of a few microns square, AEM analysis is performed on a much smaller area (i.e. on ∼ 30 nm square). The distribution of dopants and the impurity ions in the crystals were studied. AEM was found to be essential in determining the inhomogeneities of imourity ions and dopants on a nanometer scale. We discuss the implications of such inhomogeneities.
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