On the origin of Ne 2+ production in low-energy Ne + scattering from Al and Si surfaces

Abstract

We report an investigation on the inelastic energy loss of doubly charged Ne 2+ ions produced in the single scattering of Ne + from Al and Si surfaces. The inelasticity of 86 ± 5eV found in the binary encounter agrees well with the energy needed to excite two electrons from Ne + to Ne 2+*. Our results suggest that direct decay or autoionization decay of Ne +** formed subsequently by capturing one electron from the solid is the main mechanism for the production of Ne 2+ detected in ion-scattering spectroscopy.