On the origin and elimination of cross coupling between tunneling current and excitation in scanning probe experiments that utilize the qPlus sensor.

Abstract

The qPlus sensor allows for the simultaneous operation of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). When operating a combined qPlus sensor STM/AFM at large tunneling currents, a hitherto unexplained tunneling current-induced cross coupling can occur, which has already been observed decades ago. Here, we study this phenomenon both theoretically and experimentally; its origin is voltage drops on the order of μV that lead to an excitation or a damping of the oscillation, depending on the signof the current. Ideally, the voltage drops would be phase-shifted by π/2 with respect to a proper phase angle for driving and would, thus, not be a problem. However, intrinsic RC components in the current wiring lead to a phase shift that does enable drive or damping. Our theoretical model fully describes the experimental findings, and we also propose a way to prevent current-induced excitation or damping.