On the observation of dispersion in tunable second-order nonlinearities of silicon-rich nitride thin films

Hung-Hsi Lin,Benjamin M Cromey,Alex Friedman,Rajat Sharma,Felipe Vallini,Khanh Kieu,Matthew W Puckett,Yeshaiahu Fainman

doi:10.1063/1.5053704

Hung-Hsi Lin, Benjamin M Cromey + Show 6 more

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https://doi.org/10.1063/1.5053704

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Abstract

Highlights

While reported results have shown the second-order nonlinear properties of silicon nitride thin-films to vary across deposition techniques and associated conditions, work in the literature has not focused on the variety of wavelengths employed in these experimental studies
It is important to make a fair comparison of these films in terms of deposition technique, wavelength of characterization, and silicon content
These were extracted in freespace at 800 nm and in-waveguide at 1550 nm, using phasematched second harmonic generation (SHG)

Summary

Introduction

While reported results have shown the second-order nonlinear properties of silicon nitride thin-films to vary across deposition techniques and associated conditions, work in the literature has not focused on the variety of wavelengths employed in these experimental studies.

Results

Conclusion