Abstract

Abstract The motion of single dissociated dislocations in germanium and silicon has been studied directly in the electron microscope by moans of the weak-beam technique and utilizing a heating stage. The observations indicate that the dislocations glide in the dissociated configuration. Screws whose images appear as single peaks in 220 reflections with g220 parallel to the screw direction, have been shown to have cross-slipped from the (111) plane parallel to the plane of the specimen, to the steeply inclined (111) plane, on which they are dissociated. Contrast experiments and calculations show that the two partials can be resolved as sharp peaks with g202 at 60° to the screw direction.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.