Abstract

We have specified typical fabrication defects of the rapid single-flux-quantum (RSFQ) based logic gates, and then investigated the behavior of defective gates by SPICE simulation to estimate the defect coverage of logic testing. The simulation results show that the logic testing based on the stuck-at fault model can achieve at most 65% defect coverage for pulse-driven dual-rail RSFQ logic circuits and the defect coverage may increase up to 80% by properly adding two-pattern tests to the stuck-at fault tests.

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