Abstract
In this study the strain-induced grain growth was simulated on an aluminum bicrystal by using channel-die compression. After compression of the bicrystal up to 5% deformation the strain mapping were characterized by using digital image correlation (DIC) technique and the 2D strain filed provided data to simulate grain growth using a modified Monte Carlo method. The strain-induced grain growth on grain boundary was simulated and compared with experiment after annealing at 450°C for 4 hours. The relation between the deformation heterogeneity and the grain growth was discussed in this work.
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