Abstract
The amount of orientation difference of crystallites, i.e., the texture in a metallic polycrystal governs, plastic anisotropy, electrical and magnetic properties of the material. For simulating the microstructure and texture evolution during forming processes, representative volume elements (RVEs) often generated based on experimental measurements are commonly used. While the grain size and morphology of polycrystals are often determined via light-optical microscopy, their texture is conventionally analyzed through diffraction experiments. Data from these different experiments must be correlated such that a representative set of sampled orientations is assigned to the grains in the RVE. Here, the concept Texture Sampling through Orientation Optimization (TSOO) is introduced, where based on the intensity the required number of orientations is first assigned to the grains of the RVE directly. Then the Bunge–Euler angles of all orientations are optimized in turn with respect to the experimental measurements. As orientations are assigned to grains of variable size during optimization, the compatibility between inhomogeneity in the microstructure and texture is inherently addressed. This method was tested for different microstructures of non-oriented electrical steels and showed good accuracy for homogenous and inhomogeneous grain size distributions.
Highlights
Introduction and State of the ArtMany properties of polycrystalline materials such as elastic and plastic response, electrical conductivity, magnetic permeability, etc., depend upon the crystallographic texture, i.e., the orientation of individual crystallites with respect to the bulk material geometry [1]
Various aspects of the texture sampling method texture sampling using optimization (TSOO) put forward in the preceding sections will be trialed: Firstly, the capabilities of TSOO are verified by reconstructing orientation distribution function (ODF) in representative volume elements (RVEs) of artificial microstructure with an increasing degree of grain size inhomogeneity
The method is applied to RVEs of real microstructures obtained from micrographs and X-ray diffraction (XRD) experiments
Summary
Many properties of polycrystalline materials such as elastic and plastic response, electrical conductivity, magnetic permeability, etc., depend upon the crystallographic texture, i.e., the orientation of individual crystallites with respect to the bulk material geometry [1]. These crystallite orientations are commonly represented by an orientation distribution function (ODF) [2]. An ODF is constructed by measuring orientations in diffraction experiments like electron backscatter diffraction (EBSD) or X-ray diffraction (XRD). From these experiments, thousands to millions of data points are obtained for the construction of the ODF. The current study is restricted to CP-FEM for microstructure modeling
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