Abstract
The surface morphology of nanosized copper and nickel films on mica is studied using a scanning tunneling microscope. Altitude parameters and fractal dimension are determined for copper and nickel films of different thicknesses. The characteristic sizes of structural agglomerates for copper and nickel films are indicated depending on the thickness. The choice of the film thickness and the conditions for its production makes it possible to formulate recommendations for the development of the technology of “growing” structures with a given surface morphology.
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