On line optical and Auger data acquisition

Abstract

A software/hardware package has been developed for use with an 8K DEC PDP-8/L of /I minicomputer, providing real time acquisition and manipulation of optical reflectivity, Auger, and photoemission data. Optical data and Auger or photoemission data may be acquired simultaneously. Provisions have been included for the addition of a scanning rotating ellipsometer. Synchrotron radiation from an electron storage ring has been the primary optical source. Optical reflectivity is measured using single photon counting with a ratio technique that samples a portion of the incident light with one detector and the reflected light with a second detector. Differential Auger or photoemission data is acquired using a cylindrical mirror electron energy analyzer under computer control in a signal averaging mode of operation. Direct electron distribution curves may be displayed using a numerical integration routine. Software was written in assembly language to conserve available memory; however, a modular approach was used to allow easy additions and modifications to experiments. Data arrays may be manipulated and stored as single variables.